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NT-MDT NTEGRA Maximus, Large Sample SPM/AFM

For studying large samples

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  • Study of large and massive samples (up to 100mm in diameter, 15mm thick, and mass up to 1kg)
  • Analysis of matrix of one-type microsamples
  • Sequencing the system for serial measurements
  • Motorised X, Y positioning of the sample

For many industrial applications it is important to have an opportunity for studying large samples, saving the data arrays according to the prescribed algorithms in automatic mode. This may be used in the quality control of optical elements surfaces, eg. undulation of lens surface, or the study of electric parameters in the determined fields of a 100mm silicon substrate, or the testing of a big number of microsamples of polymer material while optimising the conditions of chemical synthesis for the ideal combination of mechanical properties.

Thus, specialisation of NTEGRA Maximus is the work with large samples and gathering of big data arrays in the automatic mode.