N-SIM is a powerful new Super Resolution imaging system based on Nikon's Eclipse Ti-E inverted microscope. It is capable of multi-spectral two and three dimensional nanoscopy. With lateral resolution of approximately 85nm - 100nm and axial resolution of approximately 300nm. N-SIM extends the role of the optical microscope to a level nearing molecular resolution. N-SIM has been designed with groundbreaking new technological innovations to provide unprecedented system quality and flexibility.

Nikon's new N-SIM microscopy system can produce two times the resolution of conventional optical microscopes by combining SIM technology licensed from UCSF. Based on the world renowned Eclipse Ti research inverted microscope with Nikon's legendary CFI Apo TIRF 100x oil objective lens (N.A.1.49), developed using unique optical technologies and manufacturing techniques, N-SIM also delivers the fastest imaging capability in the industry, with a time resolution of 0.6sec/frame.

Features:

• Nearly Double the Resolution of Conventional Optical Microscopes
• Time Resolution of 0.6 sec/frame, the Fastest in the Industry
• TIRF-SIM Imaging Technique
• 3D-SIM Capable

N-SIM System on Demonstration - Now in Melbourne

The Nikon N-SIM Super Resolution Microscopy System has been judged one of the ten best microscopy innovations in the 2011 Microscopy Today Innovation Award competition. This system has been on demonstration in Sydney for all of February and is now moving to Melbourne. Participants will be able to bring along their own samples and try this exciting new technology. Please contact John Zhu for further information.