The Model CPX is a versatile cryogenic micro-manipulated probe station used for non-destructive testing of devices on full and partial wafers up to 51mm in diameter. The CPX is a platform for measurement of electrical, electro-optical, parametric, high Z, DC, RF and microwave properties of matreials and test devices. Nanoscale electronics, quantum wires and dots, and semiconductors are typical materials measured in the CPX. A wide selection of probes, cables, sample holders and options make it possible to configure the CPX to meet your specific measurement applications. The CPX operates over a temperature range of 4.2K to 475K.

Features:

• High stability operation from 4.2K to 475K
• Optional temperature range from 1.5K to 400K or 20K to 675K
• Sample can be maintained at room temperature while system cools, reducing potential for condensation
• Multiple radiation shields optimised to minimise cryogen consumption
• Sample stage with ±5° in-plane rotation
• Measurements from DC to 67GHz
• Optional high vaccum to 10^-7 torr
• Optional load-lock assembly
• Accommodate up to 51mm diameter wafers
• Configurable with up to six thermally anchored micromanipulated probe arms
• Probe arms with 3-axis adjustments and ±5° theta planarisation
• Cables, shields and guards minimise electrical noise and thermal radiation losses
• Options and accessories for customisation to sepcific research needs