NT-MDT has released the second generation of their educational AFM platform. The SOLVER Nano is a compact platform providing a cost effective way of introducing AFM into your teaching program while retaining capability suitable for basic research.
Available with standard AFM probe or etched wire probe heads the SOLVER Nano is capable of basic and advanced AFM modes including electrical modes, force spectroscopy, force and voltage lithography and STM. Featuring a compact foot print, simple cantilever alignment, automatic sample approach and a 100x100x10µm scanning piezo stage the SOLVER Nano meets the challenge of a cost effective, simple to use yet fully featured teaching apparatus.
Full range of standard scanning techniques: Contact and semicontact AFM modes, EFM, MFM, Kelvin mode, SCM, spreading resistance imaging et al.
Easy-to-adjust: Special chips with alignment grooves provides fixed AFM probe placement in measuring head. This feature reduces the detection system adjusting procedure just to fine tuning of the system in accordace with the particular cantilever properties.
Compact rigid design: Provides operation reliability and high immunity to environmental loads.
Automatic setting of scanning parameters: Digital controller with adjustable proportional-integral-derivative feedback guarantees the high quality of imaging
Metrological scanning accuracy: Universal closed loop scanner provides maximum scan size 100x100µm and atomic resolution possibility obtaining on nanometre size scans
Comprehensive software: Simultaneous up to 8 signals under scanning and up to 3 signals under spectroscopy