In Scanning Probe Microscopy, the perfect instrument is only half the story. The probe is equally important. We offer a wide assortment of probes from NT-MDT, ranging from the routine silicon and polysilicon cantilevers to ultra-sharp diamond-like carbon tips, probes with different coatings, for magnetic measurements, probes for SNOM and many others. To keep your instrument properly calibrated, we can provide an extensive array of test samples as well as multiple calibration gratings with free deconvolution software. Exclusive from NT-MDT - the famous grating TGT1 for tip characterisation, super sharp DLC tips and PTB-traceable vertified gratings.