The TS70 nanomechanical test instrument is an AFM attachment that offers industry-leading nanoscale mechanical characterisation combined with scanning probe microscopy (SPM) imaging. The synergy created by interfacing the uncompromised sensitivity of the Hysitron capacitive transducer to an SPM provides superior testing capabilities previously unavailable to the materials characterisation community.
In-situ SPM Imaging
The in-situ SPM imaging capability of the TS70 is critical for precise test placement and microstructure identification. The in-situ uimages are obtained by raster scanning the indenter probe over the sample surface and can be used to reliably place a test within 10nm of the desired testing location. This technique allows for effortless pre- and post-test topographical imaging without the need to reposition an auxiliary imaging instrument over the nanoscale testing site. The force and displacement results acquired during test, in conjunction with the in-situ imaging capability, offer an unparalleled wealth of information concerning the material deformation behaviour and mechancial properties of the material.
Quantitative, Repeatable results
The compact design of the Hysitron transducer allows it to be interfaced to almost all commercially available AFM's via a simple temporary modification. The Hysitron transducer replaces the SPM detector assembly and provides topographic feedback for imaging. Utilising the same indenter probe to obtain in-situ SPM images as to perform the nanoindentation experiment guarantees quantitative and repeatable data. Additionally, the transducer utlises a rigid indenter which unlike cantilever based systems provides direct force and displacement measurements resulting in accurate and quantifiable results. The TS70 combines nanoNewton force sensitivity and picometre displacment resolution with SPM imaging for a powerful tool to aid in material studies from basic research to product development and quality control.