
The model CRX-EM-HF is a versatile cryogen-free electromagnet-based micro manipulated probe station used for non-destructive testing of devices on full and partial wafers up to 25mm (1") in diameter. The CRX-EM-HF is a platform for measurement of electrical, electro-optical, parametric, high Z, DC, RF and microwave properties of materials and test devices. Nanoscale electronics, quantum wires and Nanoscale electronics, quantum wires and dots, and semiconductors are typical materials measured in a CRX-EM-HF. A wide selection of probes, cables, sample holders, and options makes it possible to configure the CRX-EM-HF to meet your specific measurement applications.
Features:
- 6.0 kOe (0.6 T) horizontal (in-plane) field electromagnet
- Closed cycle refrigerator provides high stability cryogen-free operation from 8 K to 400 K
- Control stability to 10 mK
- Sample exchange cycle time of <4.5 h
- Low vibration design: <1 µm at sample stage (X, Y, and Z axes)
- 360° sample stage rotation option
- Measurements from DC to 67 GHz
- Accommodates up to 25 mm (1") diameter wafers
- Configurable with up to four thermally anchored micro-manipulated probe arms
- Probe arms with 3-axis adjustments and ±5° planarization
- Cables, shields, and guards minimize electrical noise and thermal radiation losses
- Options and accessories for customization to specific research needs
