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Lake Shore CRX-VF Probe Station (Cryogen-free)

Versatile cryogen-free micro manipulated probe station for wafers up to 51mm

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The Model CRX-VF is a versatile cryogen-free micro manipulated probe station used for non-destructive testing of devices on full and partial wafers up to 51 mm (2 in) in diameter. The CRX-VF is a platform for measurement of electrical, electro-optical, parametric, high Z, DC, RF, and microwave properties of materials and test devices. Nanoscale electronics, quantum wires and dots, semiconductors, and spintronic devices are typical materials measured in a CRX-VF. A wide selection of probes, cables, sample holders, and options makes it possible to configure the CRX-VF to meet your specific measurement applications.

Features:

  • 22.5 kOe (2.25 T) vertical field superconducting magnet
  • Closed cycle refrigerator provides high stability cryogen-free operation from 10 K to 500 K
  • Control stability to 10 mK
  • Sample exchange cycle time of <8.5 h
  • Low vibration design: <1 µm at sample stage (X, Y, and Z axes)
  • Measurements from DC to 67 GHz
  • Sample holders optimized for low noise, high frequency, or high impedance measurements
  • Accommodates up to 51 mm (2 in) diameter wafers
  • Configurable with up to six thermally anchored micro-manipulated probe arms
  • Probe arms with 3-axis adjustments and ±5° planarization
  • Cables, shields, and guards minimize electrical noise and thermal radiation losses
  • Options and accessories for customization to specific research needs