The Model CRX-4K from Lake Shore is a versatile cryogen-free micro-manipulated probe station used for non-destructive testing of devices on full and partial wafers up to 51mm in diameter. The CRX-4K is a platform for measurement of electrical, electro-optical, parametric, high Z, DC, RF and microwave properties of materials and test devices. Nanoscale electronics, quantum wires and dots, and semiconductors are typical materials measured in a CRX-4K. A wide selection of probes, cables, sample holders, and options makes it possible to configure the CRX-4K to meet you rspecific measurement applications.
Features:
- Closed cycle refrigerator provides high stability cryogen-free operation from 4.5K to 350K
- Optional temperature range from 20K to 500K
- Control stability to 10mK
- Sample exchange cycle time of <3.5h
- Low vibration design: <1µm at sample stage (X, Y and Z axes)
- Measurements from DC to 67GHz
- Sample holders optimised for low noise, high frequency or high impedence measurements
- Accommodates up to 51mm diameter wafers
- Configurable with up to six thermally anchored micro-manipulated probe arms
- Probe arms with 3-axis adjustments and ±5° theta planarisation
- Cables, shields and guards minimise electrical noise and thermal radiation losses
- Options and acessories for customisation to specific research needs