Large Substrate Stylus Profiler Automation and Ease of Use: Dektak XTL Delivers!
Friday 24 January 2014
Quality assurance/quality control (QA/QC) production monitoring in industries such as semiconductor and display panel manufacturing are becoming a more important part of production. This is attributed to the need for smaller, faster and more compact products with increased functionality and capability. This forces manufacturers to produce a more accurate and higher yield in order to meet the demands of their customers and successful ROI.
Bruker recently launched a new stylus profiling system, Dektak XTL, to specifically address these rising demands. Dektak XTL's key applications include metrology of surface roughness, film thickness and etch feature step height dimensions, wafer bow and stress, panel feature dimensions, among others which are keys to enabling wafer and panel production monitoring any time gage capable metrology is required for production.
Attendees in this webcast will learn about the new capabilities DektakXTL has to offer including:
» Intuitive operator interface
» Enhanced GUI for scan and measurement teaching
» Automated pattern recognition for fiducial alignment
» Quick Analyzer functionality
» Enhance automation features for multi-site inspections
» And more...