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Bruker Introduces Contour Elite 3D Optical Microscopes

The new Contour Elite 3D offers for the first time fully integrated high-definition microscopy imaging with industry-leading three-dimensional (3D) optical metrology functionality. This latest generation of Bruker interferometric optical technology delivers the high-speed operation, accuracy and repeatability required for top-level R&D, and adds the imaging and display advantages commonly associated with confocal microscopy. Download the brochure to learn more.

Precision Surface Characterisation Yields Quantitative Analysis of Cutting Tool Coatings and Wear

The ability to quantitatively analyse surface coating structure and wear is an important qualification within the precision tooling industry to assess cutting tool life under different cutting conditions. This however can be challenging prospect for CMM's due to the lack of 3D measurement resolution, and for stylus based tools due to the complex shape and often smaller feature size of the tools.

In a recent development by Bruker Surface Analysis group their white-light technology, such as the NP-FLEX and Contour Elite 3D microscopes, was applied to the study of drill bit coatings under controlled conditions to assess the subtle surface changes of different coatings.

The study utilised the nanometre vertical measurement sensitivity of the 3D interferometric technique employed on the instrument to assess surface wear after only a few drilling processes. Qualifying surfaces to new ISO2012 standards for 3D surface parameters, such as Sa and Str, provide a statistical approach to understanding wear and removes any subjective assessment which can lead to incorrect conclusions. The case study investigated the pre and post wear surfaces at the apex of the drill bits in QC environment as well as along leading edge cutting regions to quantitatively assess coating wear. From this study an understanding of the coating of choice was determined.

Click to review the article in full.

Bruker Webinar : Nanoscale Chemical Identification for Materials Science and Biomolecular Imaging

Date: Thursday 4 June 2015, 1am AEST


Due to their unique absorption fingerprint, many materials can be conveniently characterised in the infrared spectral region. However, diffraction limits the spatial resolution to several microns.

In this webinar Bruker present the Inspire with PeakForce IR, an integrated nanocharacterisation tool that enables straightforward nanoscale infrared absorption and reflection imaging while simultaneously accessing nanomechanical and electrical information with molecular resolution.

Bruker will show new results in biomolecular, polymer, and graphene plasmon imaging, and explain the complete workflow for obtaining these new kinds of high-resolution correlated data.

EDAX Webinar : Smart SDD Technology with Quantitative Routines for Applied TEM Analysis

Date : Friday 12 June, 12am AEST


While silicon drift technology has been prevalent in the SEM marketplace for over 10 years, the conversion has been much slower for the TEM.

The challenge was to design SDD's with big chip sizes in combination with small end caps to get as close as possible to the pole piece of the TEM and avoid shadowing effects. It is only recently that SDD's have been designed to maximise the analytical performance of the TEM. With the new Octane T series, EDAX has advanced SDD technology through a series of innovations. The detectors maximise both size and geometry, ensuring that users have the best analytical performance from their TEM.

This webinar will explain the specifications of the Octane T series detectors. EDAX will show how complex it is to determine the solid angle and to compare these numbers. EDAX will also demonstrate the quantification routine on TEM's based on the Cliff-Morimer Method, which is used in the TEAMTM software.


Christian Gow
(07) 3345 9556 (0408) 617 243 Email
Andrew Masters
(0439) 819 095 Email

Coherent Scientific Pty. Ltd., Inc. in South Australia, Established in 1989, ABN 20 008 265 969 

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