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Bruker Dimension XR SPM

Bruker Dimension XR SPM

Bruker Dimension XR SPM

Unique packaged solutions for advanced research in nanomechanical, nanoelectrical and nanoelectrochemical characterisation

Bruker NanoSurfaces

Quantitative Analysis for Nanomechanical Applications

 

The Dimension XR Nanomechanics configuration for Icon and FastScan AFM systems provides the complete set of capabilities necessary to rapidly and quantitatively characterise materials for their nanomehcanical characteristics, on samples ranging from soft sticky hydrogels and composites to stiff metals and ceramics.

The XR Nanomechanics bundled solution encompasses the full evolution of nanoscale AFM nanomechanical measurement techniques, including Bruker's new, revolutionary AFM nano-dynamic measurement analysis. This is the first and only AFM solution that ties to bulk DMA.

Revolutionary AFM-nDMA

For the first time an AFM can provide complete and quantitative viscoelastic analysis of polymers at the nanoscale, probing materials at rheologically relevant frequencies, in the linear regime. Proprietary dual-channel detection, phase-drift correction, and reference frequency tracking enable a small strain measurement in the rheologically relevant 0.1 Hz to 20 kHz range for nanoscale measurements of storage modulus, loss modulus, and loss tangent that tie directly to bulk DMA.

 

Multi-Dimensional Nanoelectrical Characterisation

The Dimension XR Nanoelectrical configuration for Icon and FastScan AFM systems includes the most complete array of electrical AFM techniques on a single system. PeakForce TUNA™ and PeakForce KPFM™ have already built an impressive publication record of expanding materials research from conventional contact-based electrical modes to correlative electrical and mechanical data.

Now, Bruker’s new DataCube modes provide multidimensional nanoscale information at every pixel, simultaneously capturing in a single measurement both electrical and mechanical characteristics.

Proprietary DataCube Modes

These modes utilise FASTForce Volume to perform a force-distance spectrum in every pixel, with a user-defined dwell time. Using high data capture rates, a multitude of electrical measurements are performed during the dwell time, resulting in electrical and mechanical spectra at every pixel. DataCube modes provide full characterisation in a single experiment, which is unheard of in a commercial AFM.

 

Highest Resolution Scanning Electrochemical Imaging

The Dimension XR NanoEC configuration for Icon and FastScan AFM systems provides a turnkey solution for real-time quantitative analysis of electrochemical reactions. These systems utilise EC-AFM and PeakForce SECM™ modes to perform in-situ topography scans in the electrochemical cell, and are specifically designed for long-term in situ electrode studies under electrochemical control and in volatile solvents.

Exclusive PeakForce SECM

With a spatial resolution less than 100 nanometres, this mode redefines what is possible in the nanoscale visualisation of electrical and chemical processes in liquid. PeakForce SECM dramatically improves, by orders of magnitude, the resolving power over traditional approaches. This enables entirely new research into energy storage systems, corrosion science and biosensors, opening the door to novel measurements on individual nanoparticles, nanophases, and nanopores. Only, PeakForce SECM provides simultaneous capture of topographic, electrochemical, electrical, and mechanical maps with nanometre-scale lateral resolution.

 

For further information please contact us or download the datasheet.

                                                                     

Dimension XR brochure                                                                  Read more on Bruker's website