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Understanding Kelvin Probe Force Microscopy (KPFM)

Designed for AFM Users to Support your Research Needs

Thursday 16 December, 2pm AEDT



The combination of Atomic Force Microscope (AFM) of Kelvin Probe technique brings a powerful tool to map Contact Potential Difference (CPD) on conducting and semi-conducting samples. The basic idea of KPFM is the same - An AC voltage with certain frequency as applied between AFM tip and sample; and the resulting electrostatic force is detected by a lock-in amplifier.


Join this webinar to learn what signals are acquired from the lock-in amplifier and how they are used as feedback to measure the CPD. Common questions would also be answered including :

  • Which channel should be monitored during KPFM measurement?
  • Can HOPG be used as a standard sample for KPFM?
  • Any parameters other than lift height and AC voltage, can be adjusted to improve the measurement?
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BioAFM Update Webinar : Improved Spatial and Temporal Resolution

Wednesday 1 December 2021, 2pm AEDT


As the value of Atomic Force Microscopy (AFM) in life science has been increasingly recognised, its applications have been expanded well beyond the basic topography and nanomechanical characterisation. Efforts have been devoted to improving the performance of AFM and innovating new functionalities. For example, the limits of spatiotemporal resolution have been abidingly pushed to resolve detailed features or dynamic events at bio samples; sophisticated models and specialised hardware have been introduced to not only improve the accuracy of nanomechanical measurements, but also make dynamic mechanical analysis at nanoscale possible; seamless integration to other optical technologies makes AFM no longer a standalone tool but a multi-functional analysis platform.

In this webinar, we are going to share the recent developments on BioAFM, and more importantly, to showcase how these improvements and innovations have helped solve practical questions researchers have been keen to answer.

Speaker Bio:
Dr. Yun Chen works as Application Scientist at Bruker Nano Surfaces, focusing on exploring application and providing technical support of surface metrology and tribology instruments. He was academically trained in biomedical engineering, biotechnology, and physical chemistry. His PhD work in University of Groningen, Netherlands focused on investigating bacterial behaviors on various biomaterial surfaces. Before joining Bruker, Yun pursued his academic career in Leeds University, UK, working on resolving molecular interactions and kinetics involved in the initial stage of amyloid formation. 

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Nanomechanical Testing and Property Correlation Webinar Series

Depth Sensing Nanoindentation is a simple yet powerful technique to study the mechanical properties of material at nano to microscale scale. Nanoindentation is not just a metallurgist tool. It is widely accepted in the field of bioscience, tissue engineering, development of biomedical devices and sensors; and is applicable in industries ranging from pharmaceuticals (crystal engineering), aerospace (thermal barrier coating), to automobile (protective coatings, high strength steel) and Abrasives.


Bruker and Industron are pleased to present a series of webinars where we will share from the basics of Nanomechanical Testing to the latest advancements. Join us in this 4 parts webinar series to learn more. 


Webinar 1 | Wednesday 17 November 3:30pm AEDT
Introduction to Depth-Sensing Nanoindentation and Nano-Tribological Testing and Applications

Webinar 2 | Friday 26 November 3:30pm AEDT
Advanced Dynamic Nanomechanical Testing and High Temperature Application

Webinar 3 | Wednesday 8 December 3:30pm AEDT
Introduction to In-Situ Nanoindentation Testing and Property Mapping

Webinar 4 | Friday 17 December 3:30pm AEDT
Tensile and High Temperature Nanoindentation inside Scanning Electron Microscope (SEM)

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Introducing the New Dimension IconIR

Wednesday 10 November 2021, 12 Midnight AEDT
(If you are not a night owl, please register via the link below to have a copy of the webinar sent to you after the event)




Introducing the NEW Dimension IconIR, a system that combines Bruker’s industry-leading Dimension Icon® AFM and nanoIR™ photothermal IR nanospectroscopy to establish new standards in nanoscale property mapping. The IconIR delivers a comprehensive correlative spectroscopy and microscopy solution for quantitative nanochemical, nanomechanical and nanoelectrical characterisation on a single platform.


Please join us and our special guest Prof. Alex Dazzi, University Paris-Saclay, France, for this 2-hour virtual workshop where we will introduce the IconIR, and demonstrate exciting new features and state-of-the-art capabilities.


Featuring sub-10nm chemical imaging resolution with monolayer sensitivity, the system’s large-sample architecture significantly extends the capacities of the Dimension Icon, the world’s most used large-sample AFM platform, to provide ultimate sample flexibility and renowned performance.


The standard system supports samples of up to 150mm, with options for larger samples also available. Bruker’s patented suite of photothermal-based AFM-IR spectroscopy modes is the most comprehensive available, with hundreds of publications demonstrating its success as the world’s leading nanoIR technology.


The IconIR is expected to enable groundbreaking research across a broad range of polymer, geoscience, semiconductor, and life science applications.

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AFM Probe Selection Webinar

Join us for a free virtual workshop on AFM probe selection on Wednesday 27 October 2021. During this workshop Mickael Febvre and Alexander Dulebo will explain the fundamentals of AFM probe design, provide an overview of the probes available and their properties, and outline how to select the right probe for the right application. There will also be a short presentation on the latest innovations in probe development for biological and materials sciences applications.


Meet the Bruker Team


Dr Mickael Febvre, Application Manager
Dr Alexander Dulebo, Application Scientist


Session 1 : 9am BST  |  10am  CEST  |  7pm AEDT
Session 2 : 4pm BST  |  5pm CEST  |  8am PDT  |  2am AEDT (Thurs 28 Oct)

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