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Virtual Wokshop : AFM for Critical Dimension - Metrology of Trenches, Lines and Gratings

Wednesday 27 July 5am NZST, 3am AEST, 1am AWST
 



Electronic devices are getting smaller and more efficient, and thus require higher quality in the inspection of semiconductor microfabrication processes. Characterising critical dimensions of various component structures is an essential step to provide quality control feedback on fabrication processes. Current technology features component structures (e.g., trenches, lines and gratings) that measure down to a couple of hundred nanometers, which excludes the usage of optical microscopes due to the light diffraction limit. However, atomic force microscopy (AFM) can provide nanometer accuracy in x, y and z directions without damaging components and, therefore, is a very useful tool for characterising these structures.

 

In this workshop, Bruker will briefly cover the applications of AFM in the characterisation of trenches, lines and gratings. Firstly, an introduction to the Dimension Icon AFM, a large‑platform system that utilises proprietary PeakForce Tapping mode for superior critical dimension measurement performance. Then we will discuss AutoMET, a software option that allows users to automatically measure samples with the help of pattern recognition, including offline batch data process specifically for these structures. Finally, we will conclude the workshop with a live demonstration showing how to measure a patterned sample.

 

Speakers:

Senli Guo, Ph.D., Sales Applications Engineer, Bruker
John Thornton, Applications Engineer, Bruker

 

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Virtual Workshop : Next-Generation Ferroelectric Materials Research

Thursday 30 June 2022 2am NZST, 12 midnight AEST, 10pm AEST (Wed 29th)
 

REGISTER


Join us for this virtual workshop on Switching Spectroscopy Piezoresponse Force Microscopy (SS-PFM).
 

Bruker’s new NanoScope 6 controller technology features:

  • 5x lower noise and 20x faster speed
  • Sampling practically without bit-step limitations
  • More capabilities for advanced mechanical and electrical measurements

 

An example of this improved AFM-controller performance is the Switching Spectroscopy Piezoresponse Force Microscopy (SS-PFM) mode. SS-PFM enables the highly accurate nanoscale characterisation of the properties of ferroelectric materials. The SS-PFM mode expands upon the standard Piezoresponse Force Microscopy (PFM) by greatly improving the sensitivity and accuracy of measurements.

 

Highlights:

  • Learn how to characterise advanced properties of ferroelectric materials with SS-PFM mode.
  • Get practical guidance for using SS-PFM to generate a hysteresis loop and characterise properties of ferroelectric materials otherwise inaccessible by PFM modes

 

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Webinar : Bruker Microscopes Fill the Gap Between Fluorescence and Electron Microscopy

Tuesday 14 June 2022, 9am PDT
 


The imaging and characterisation of biological structures and processes have moved beyond the capabilities, resolution and speed of conventional fluorescence and electron microscopes. Eukaryotic cells consist of organelles and other subcellular structures so small they can only be resolved in detail with super-resolution methods. Such cells have membranes with mechanical properties best investigated at the nanoscale using atomic force microscopy. Neurons form circuits in the brain so far from the surface only two-photon microscopy can reach them. To visualize individual cells, neurons or even molecules in the context of an entire living organism requires light‑sheet microscopy.

Bruker has developed a suite of such advanced microscopes that collect information from cells, complex organ/tumor/tissue models or entire organisms in‑vivo; information not accessible with traditional fluorescence or electron microscopy. In this webinar, experts from Bruker discuss the technology behind atomic force, super‑resolution, two‑photon, and light‑sheet microscopy. We will highlight applications in which these technologies are essential to solving biological mysteries.

Webinar Presenters:

Romina Macco, Ph.D.
Bruker
Torsten Mueller, Ph.D.
Bruker
Lina Streich, Ph.D.
Bruker
Winfried Wiegraebe, Ph.D.
Bruker

 

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Virtual Workshop : Nanoscale Characterisation of Glass and Ceramic Surfaces

Wednesday 1 June 2022 12 midnight (2 Jun) NZST, 10pm AEST, 8pm AWST
 


Bruker is dedicated to providing a complete range of high-performance metrology techniques for the nanometre-scale surface characterisation of glass and ceramic products. Join us for this virtual Surface Lab session where we will present a range of characterisation techniques, their features, capabilities, and applications.

 

Highlights of the workshop:

  • LIVE demos on cutting-edge Bruker instruments
  • Nanoscale Investigation of glass & ceramics: Gorilla glass, float glass, and metallic glass
  • Measurements on silicon coatings
  • Thin Film Analysis

 

The following techniques will be covered:

Atomic Force Microscopy: For high-resolution, topographical, nanomechanical, nanoelectrical, and nanoelectrochemical characterisation of materials.
Nano-Indentation: Nano-mechanical characterisation using nano-indentation methods
Optical Profilers: For 2D roughness surface characterisation and advanced 3D mapping and measurement of thin film thickness, stress, surface roughness and form

 

Speakers:

Dr Peter De Wolf
Worldwide Application Director
Dr Mickael Febvre
Application Manager Europe
Dr Ude Hangen
Applications Manager
Dr Vishal Panchal
Application Scientist
Dr Udo Volz
Application Scientist
 

 

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Webinar : Nanoscope 6 : Benefits of the Added Capability and Performance

With continuous developments over the past more than three decades, atomic force microscopy (AFM) has become an essential characterization technique, enabling the discoveries across a nearly countless array of disciplines and applications due to its unique capability of conveying rich physical and chemical information at nanometer scale. As the leader in the advances of AFM technology since the introduction of the first commercial system in the 1980s, Bruker is proud to release the brand-new Nanoscope 6 controller. With the full-spectrum hardware upgrades, the Nanoscope 6 controller not only boosts the AFM performance, but also provides many new capabilities and features, which could offer scientists new opportunities to obtain richer and finer information on complex samples. 20 times faster data acquisition and processing can capture fine details hidden within the force-distance curves in the popular PeakForce Tapping modes, and it also significantly improves the signal-to-noise ratio in other modes like Tapping mode and Contact Resonance-based modes. Switching Spectroscopy PFM mode offers a full suite to quantify nanoscale switching dynamics in ferroelectrics, from data collection to automatic data analysis. AFM-nDMA provides an accurate and complete solution to access the viscoelastic properties at nanoscale.

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