JEOL NeoScope JCM-7000 Benchtop SEM

This 4th generation Neoscope incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes. It is equipped with a large chamber, high and low vacuum modes, secondary and backscatter electron detectors, real-time 3D imaging, highly-advanced auto functions and the option to add a fully embedded EDS with real-time, ‘Live’ analysis.
Features:
- Zeromag - simplifies navigation and enhances throughput. Provides a seamless transition from an optical (or holder graphic) to SEM image
- Highly-advanced Auto functions for automatic condition setting and image formation in minutes
- High resolution (100,000X) and large depth of field
- High and low vacuum modes for managing a wide variety of samples
- Large chamber : maximum sample size 80mm (D) x 50mm (H)
- Advanced functions built-in such as : Automated montage and Live 3D imaging
- Option: Fully embedded EDS with Live (real-time) analysis
- Smile ViewTM Lab for integrated management of image and analysis data
NEW - ZEROMAG
- Zeromag simplifies navigation and enhances throughput
- With Zeromag, you can navigate from a colour optical image - as you increase the magnification, you transition from the optical to live SEM image automatically
- Set up large area automated image monatge and stiching; EDS option includes automated montage X-ray map
- Automatically link SEM image, position, optical image, and EDS data (with EDS option)
NEW - LIVE 3D IMAGING
With the EDS option, the 6-channel, high sensitivity, solid state backscatter electron detector acquires composition, topographic and shadow (combination of composition and topography) images, and supports live 3D imaging.
Combine the live 3D image with software to create a 3D model and calculate surface texture data including cross-sectional profile, height and surface roughnesss
NEW - LIVE ELEMENTAL ANALYSIS
Utilising the optional EDS, with live elemental analysis, you can:
- View EDS- spectra in real time as you search for an area of interest
- Set analysis points, area, map positions and line scans
- View major elements detected, and automatically display on live EDS window
For further information please contact us or download the datasheet.
Mode | High-vacuum mode: Secondary electron image Backscattered electron image (Composition, topographic and shadow. 3D images) Low-vacuum mode: Backscattered electron image (Composition, topographic and shadow, 3D images) |
Electron gun | Tungsten filament/Wehnelt integrated grid |
Accelarating voltage | 3 stages 15kV/10kV/5kV |
Specimen stage | X-Y motor drive stage X: 40mm; Y: 40mm |
Maximum specimen size | Diameter 80mm, height 50mm |
Specimen exchange | Draw-out mechanism |
Pixels for image acquisition | 640 x 480 1280 x 960 2,560 x 1,920 5,120 x 3,840 |
Automated functions | Alignment, focus, stigmator, brightness/contrast |
Measurement functions | Distance between 2 points, angles, line wdith |
File format | BMP, TIFF, JPEG, PNG |
Computer | Desktop PC Windows® 10 |
Monitor | 24 inch |
Vacuum system | Full-automatic TMP:1, RP:1 |