Webinars

Date : Tuesday 11 March 2025
Time : 2pm NZDT  |  12 midday AEDT  |  9am AWST

In this webinar, we will explore how stylus profilers can characterise a diverse range of materials, particularly in microelectronics and semiconductor applications. Additionally, we will introduce Bruker’s new 11th generation Dektak Pro^TM Stylus Profiler, providing even more enhanced operability, reliability, and measurement accuracy. Presented by Christian Gow.

The new Dektak Pro^TM stylus profilometer is the next-generation profiler in the industry-leading Dektak® product line. Incorporating over 55 years of innovation, the new benchtop system provides an expanded measurement area up to 200 mm of full-sample access for semiconductor applications, as well as improved productivity with improved user experience and measurement accuracy. Dektak Pro incorporates advancements that solidify the brand as the world's most advanced stylus profiler suitable for R&D, process development and QA/QC present and future needs across a range of industrial and research markets.

Date: Friday 14 March 2024
Time: 3am NZDT  |  1am AEDT  |  10pm AWST (13 Mar)
 

Join us for another informative webinar. In this session, we will focus on the best practices for taking high resistance measurements. Presented by Noah Faust, Lake Shore Cryotronics Electrical Development Engineer, this comprehensive webinar is designed for beginners and those with an intermediate knowledge of measuring high resistance.

In this webinar, we will:

• Show a demonstration of measuring high resistance
• Discuss techniques and best practices for high resistance measurements
• Talk about parasitic capacitance and leakage

At the end, we will then have a Q&A period with Jason Chonko, Senior Presales Applications Engineer, and David Daughton, Senior Applications Scientist Manager, answering questions. See you there!

Date: Thursday 27 February 2025
Time: 4am NZDT  |   2am AEDT  |   11pm AEST (26 Feb)
 

If you are not a night owl, resiter your interest and the recording will be sent to you after the event.

For electron backscatter diffraction (EBSD) users, typical measurement results consist of maps and charts displaying the microstructure of the sample. In many cases, these may simply be generic maps like inverse pole figure (IPF) and image quality (IQ) maps, which can easily be generated with a single mouse click. In addition to these basic analysis options, the EDAX OIM Analysis™ software offers an extensive range of analytical tools to quantify many of your materials’ microstructure components. Customisation of your analyses allows targeted and highly detailed analysis of specific features of the microstructure.
 

To better lead users through all the capabilities, OIM Analysis 9.1 introduces a new ribbon bar layout that combines easy access to the basic analysis tools with powerful customisation capabilities using templates. This webinar will guide you through the workflow and capabilities of OIM Analysis 9.1 from basic data analysis to automatic reporting.

Date: Friday 21 February 2025
Time: 3am - 4am AEDT

In spectroscopy, CCD or EMCCD technology is usually used. However, researchers are moving towards sCMOS technology due to their higher spectra rates and high dynamic ranges. This webinar will delve into how sCMOS technology could be beneficial in some applications with some examples where the technology is already being used. Folusho Balogun is a field application specialist in spectroscopy covering the EMEAI region. Folusho’s background is in spectroscopy where she worked in a photonics group using ultrafast techniques such as Transient Absorption Spectroscopy, THz spectroscopy and Time Resolved Photoluminescence. 
 

Learning Objectives:
• To understand the difference between CCD and sCMOS technology
• To understand the main benefits of sCMOS technology that is applicable to spectroscopy
• To know different applications that sCMOS technology is already being used in

Date : Friday 14 February 2025
Time : 1:30pm NZDT  |  11:30am AEDT  |  8:30am AWST
 

Join us as we venture into the applications of how Bruker's latest AFM technology can help you in your research and work. Dimension Nexus™ delivers an ideal combination of data quality, experiment flexibility, and ease of use in a small-footprint system. It incorporates the milestone innovations of Bruker's NanoScope® 6 controller and PeakForce Tapping® technology to deliver more functionality than competing systems in its class. Suitable for both routine and custom experiments and easily upgradable in the field, Nexus consistently generates highly accurate, repeatable, publication-ready results for a wide range of sample types in both research and industry applications.

We look forward to seeing you in the webinar.

Webinar Speakers : Christian Gow, Coherent Scientific