The Nikon Eclipse L300N/L300FPD Waver Inspection microscopes incorporate Nikon's renowned CFI60 infinity optics, offering the world's highest level of optical performance. The enhanced epi-fluorescence function, which enables 365nm UV excitation, is optimal for the inspection of semiconductor resist residues on 300mm wafers and organic electroluminescence displays.

Many Observation Methods: Epi-flourescence, diascopic illumination, brightfield, darkfield, simple polarising and DIC are all possible
Motorised Mercury Fibre Illuminator: Pre-centred fibre illuminator provides superior epi-fluorescence observation
Four Times Brighter than Conventional Diascopic Observation
High Intensity 12V - 50W Halogen Illuminator
CFI60 Optics Offer Longer Working Distance and High NA
Motorised Universal Nosepeice: New design is three times more durable than conventional models
Target for Easier Focusing: Allows easy and accurate focusing on low-contrast samples
Antistatic Coatings for Stronger Safeguards Against Contamination
Tilting Trinocular Eyepiece Tube for Observation at Optimum Eyepoint Level
Fixed-position X-Y Fine Movement Control located Close to Operator
Easy Access Controls
NIS-Elements Imaging Software: Provides optimised workflow observation, image capture and analysis