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Lake Shore 2Dex Hall Sensors

Lake Shore are pleased to announce the release of the new 2Dex Hall sensors, offering a new level of precision and convenience for engineers. These new Hall sensors offer excellent sensitivity and are highly linear over a very wide field range. Also, the sensors have a smaller, ultra-thin active area which ensures more accurate field readings and all but eliminates planar Hall effect errors that have caused measurement offsets in current-generation 3-axis probes.

For further information please contact us or read more.

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New Bruker/JPK NanoWizard ULTRA Speed 2 AFM

Bruker introduces the new JPK NanoWizard® ULTRA Speed 2 AFM. The system combines highest speed and highest resolution AFM with advanced bio-imaging features:

  • High-speed imaging with 10frames/sec with excellent resolution
  • Now with Bruker's exclusive PeakForce Tapping as standard
  • Revolutionary new workflow-based user interface for argonomics and ease of operation
  • New tiling funcitonality for autoamted mapping of large sample areas together with the HybridStage
  • NestedScanner Technology for high-speed imaging of surface structures up to 8um
  • Unique integration with optical microscope by tip-scanning design and the newly enhanced DirectOverlay 2 mode for most precise correlative microscopy
  • New Vortis 2 controller with high-speed low-noise DAC's and cutting-edge position sensor readout technology
  • Highest flexibility and upgradeability with a broad range of modes and accessories

For further information please contact us or download the datasheet.

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New FastHall Controller

Lake Shore has released the revolutionary MeasureReady M91 fastHall controller. Featuring a patented new measurement technqiue, this all-in-one instrument fundamentally changes the way the Hall effect is generated and measured by eliminating the need to switch the polarity of the applied field during measurement.

This technqiue delivers significantly high levels of precision, speed and convenience to researchers involved in the study of electronic materials, especially when using high-field supercondcuting magnets or measuring very low-mobility materials.

For further information please read more, download the datasheet or contact us.

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New Dimension XR Scanning Probe Microscope

Bruker are please to release the Dimension XR family of scanning probe microscopes (SPM's). These new systems incorporate major AFM innovations, including Bruker's proprietary and exclusive DataCube nanoelectrical modes, AFM-SECM for energy research and the new AFM-nDMA mode, which for the first time correlates polymer nanomechanics to bulk dynamic mechanical analysis (DMA).

For the first time an AFM can provide complete and quantitative viscoelastic analysis of polymers at the nanoscale, probing materials at Rheologically relevant frequencies, in the linear regime. Proprietary dual-channel detection, phase-drift correction, and reference frequency tracking enable a small strain measurement in the rheologically relevant 0.1H to 20kHz range for nanoscale measurements of storage modulus, loss modulus, and less tangent that tie directly to bulk DMA.

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Bruker's New Deep Trench Probes

Bruker's new PeakForce Deep Trench (PFDT) series of probes are engineered to provide depth metrology and imaging on the most challenging structures encountered on semiconductor samples and optics, including trenches and pits with aggressive aspect ratios and depth of more than 100nm

PeakForce Tapping is well known to be ideal for aggressive geometrics, such as deep and narrow trenches, as it avoids air damping and sticking effects that plague approaches based on resonant modes such as Tapping or non-contact. The cantilever shape, spring constant, and resonance frequency of these probes are highly optimised for PeakForce Tapping, and the spike angle is tilt corrected for Dimension Icon. The result is repeatable, accurate metrology with high throughput and long tip life. Read more.

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