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Webinar : Evaluate Surface Coating Mechanical and Frictional Properties

Thursday 27 June 2019


New Zealand (NZST) : 5:30pm
Brisbane/Sydney/Canberra/Melbourne/Hobart (AEST) : 3:30pm
Adelaide (ACST) : 3pm
Perth (AWST) : 1:30pm



In the modern engineering community there is a growing need to reduce friction, wear rate and increase durability of the mechanical components. Traditionally these problems were resolved by changing the bulk materials or by utilising lubrications. The recent development in surface engineering fueled by our understanding of the importance of surface properties on tribology and development of new coating and treatment methods have provided another approach to friction and wear control. From biomedical to optical and from microelectronics to decorative applications, coating now plays a major role. 

In this webinar presented by Bruker Nano Surfaces we investigate the measurement and characterisation of surface coatings and their mechanical properties. Specifically we will look in to characterising the adhesion strength between coating and the substrate and the hardness of the coatings. We will also touch on wear and lifetime characterisation of the coated surfaces.

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Lake Shore 2Dex Hall Sensors

Lake Shore are pleased to announce the release of the new 2Dex Hall sensors, offering a new level of precision and convenience for engineers. These new Hall sensors offer excellent sensitivity and are highly linear over a very wide field range. Also, the sensors have a smaller, ultra-thin active area which ensures more accurate field readings and all but eliminates planar Hall effect errors that have caused measurement offsets in current-generation 3-axis probes.

For further information please contact us or read more.

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New Bruker/JPK NanoWizard ULTRA Speed 2 AFM

Bruker introduces the new JPK NanoWizard® ULTRA Speed 2 AFM. The system combines highest speed and highest resolution AFM with advanced bio-imaging features:

  • High-speed imaging with 10frames/sec with excellent resolution
  • Now with Bruker's exclusive PeakForce Tapping as standard
  • Revolutionary new workflow-based user interface for argonomics and ease of operation
  • New tiling funcitonality for autoamted mapping of large sample areas together with the HybridStage
  • NestedScanner Technology for high-speed imaging of surface structures up to 8um
  • Unique integration with optical microscope by tip-scanning design and the newly enhanced DirectOverlay 2 mode for most precise correlative microscopy
  • New Vortis 2 controller with high-speed low-noise DAC's and cutting-edge position sensor readout technology
  • Highest flexibility and upgradeability with a broad range of modes and accessories

For further information please contact us or download the datasheet.

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New FastHall Controller

Lake Shore has released the revolutionary MeasureReady M91 fastHall controller. Featuring a patented new measurement technqiue, this all-in-one instrument fundamentally changes the way the Hall effect is generated and measured by eliminating the need to switch the polarity of the applied field during measurement.

This technqiue delivers significantly high levels of precision, speed and convenience to researchers involved in the study of electronic materials, especially when using high-field supercondcuting magnets or measuring very low-mobility materials.

For further information please read more, download the datasheet or contact us.

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New Dimension XR Scanning Probe Microscope

Bruker are please to release the Dimension XR family of scanning probe microscopes (SPM's). These new systems incorporate major AFM innovations, including Bruker's proprietary and exclusive DataCube nanoelectrical modes, AFM-SECM for energy research and the new AFM-nDMA mode, which for the first time correlates polymer nanomechanics to bulk dynamic mechanical analysis (DMA).

For the first time an AFM can provide complete and quantitative viscoelastic analysis of polymers at the nanoscale, probing materials at Rheologically relevant frequencies, in the linear regime. Proprietary dual-channel detection, phase-drift correction, and reference frequency tracking enable a small strain measurement in the rheologically relevant 0.1H to 20kHz range for nanoscale measurements of storage modulus, loss modulus, and less tangent that tie directly to bulk DMA.

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