Introducing the New Sona sCMOS Camera
The latest model in the Sona back-illuminated sCMOS microscopy camera series has arrived.
The NEW Sona 4.2B-6 provides a superb balance of sensitivity, speed and resolution, making it perfectly suited to many challenging imaging applications. The new model joins the Sona 4.2B011, which offers the largest possible field of view at 32mm.
- High sensitivity: Up to 95% QE
- Fast Speeds: Up to 74fps
- Large Field of View: Up to 32mm
- Deep Cooled: -45°C cooling
- Protected: UltravacTM sensor enclosure
Webinar : How to Improve Characterisation Efficiency for EBSD and EDS Applications
Friday 13 December
Auckland (NZDT) : 5:00am
Brisbane (AEST) : 2:00am
Sydney, Canberra, Melbourne, Hobart (AEDT) : 3:00am
Adelaide (ACDT) : 2:30am
Perth (AWST) : 12:00am
Energy Dispersive Spectroscopy (EDS) and EBSD are well-established microanalysis tools for today's characterisation laboratories. New developments in both hardware and software allow for improved efficiencies for users. In this webinar, improvements using EDAX's APEXTM and OIMTM Analysis software will be presented, showing users how they can accomplish more with less effort and time.
Presented by EDAX EBSD Product Manager, Matt Nowell.Read More
Webinar : Accelerating Semiconductor Processes Control
Tuesday 17 December
Auckland (NZDT) : 10:00pm
Brisbane (AEST) : 7:00pm
Sydney, Canberra, Melbourne, Hobart (AEDT) : 8:00pm
Adelaide (ACDT) : 7:30pm
Perth (AWST) : 5:00pm
Recent advances in 3D Optical Metrology accelerate in-line quality control for both front and back end processes. In this webinar, Bruker present case studies that address improving yield, identifying root cause failure and driving next generation device development from bare wafer to final packaged device.
Bruker will highlight requirements for advanced telecommunication, compact on-board electronics, and electric vehicles covering metrology needs for denser interconnect networks, finer redistribution layer (RDL), direct wafer to wafer bonding and wafer fan-out packaging.
Front end (FEOL) examples will include:
- Wafer bin roughness and edge roll-off
- CMP efficiency full die flatness
- CD metrology including TSV, deep trench RIE (Bosch process)
- Epi layer defect quantification in high power devices
Back end (BEOL) and packaging examples will address:
- Under Bump Metallisation (UBM)
- Recess defect inspection
- Full die screening for dense interconnect control
Speaker: Samuel Lesko, Senior Manager for Optical and Tribology Applications, Bruker Nano Surfaces DivisionRead More
OBIS Lasers and Power Meters on Sale
For all orders placed by 20 December 2019, Coherent Scientific is offering a 10% discount on all OBIS laser and Laser Measureemnt and Control products.
Contact Jeshua Graham Ph: (0488) 177 540 for a quotation today !
OBIS is a portfolio of compact UV, visible and near-IR lasers. OBIS also includes free space and fibre coupled units, beam combiners, miniaturised OEM laser formats and accessories.
- Wavelengths ranging from 355nm to 980nm
- Output powers up to 365mW
- OPSL technology for superior beam parameters
- Smallest footprint diode laser module on market
- Easy integration into larger optical systems with various control methods
As the world's leading producer of laser systems, Coherent thoroughly understands the practical requirements and challenges of using laser measurement tools, putting us in a unique position to configure a laser measurement system that provides the right combination of performance, features, and cost for your specific needs. Download the catalogue to explore our full line of Laser Power Meters and Laser Energy meters and find the right device for your application
- Measure all laser types: CW, quasi-CW, pulsed and ultrafast
- Measure all wavelengths: UV through to IR
- Various meter options for readout, ranging from simple point measurements to long term laser diagnostics
- PowerMax and EnergyMax-USB models available for direct connection to your lab PC
Nikon End of Year Sale Starts Today !
Significant savings are now available on Nikon's range of optical microscopes and digital cameras.
Contact us today for a quotation !
|Eclipse Ni Advanced Research Upright Microscope||Eclipse Ci Clinical Upright Microscope|
|Eclipse E200 Educational Microscope||Eclipse E100 Student Microscope|
|SMZ25 Advanced Research Stereomicroscope||SMZ18 Advanced Research Stereomicroscope|
|SMZ1270 Zoom Stereomicroscope||SMZ800N Zoom Stereomicroscope|
|SMZ745 Zoom Stereomicroscope||SMZ445 Compact Stereomicroscope|
|Eclipse Ti2 Advanced Research Inverted Microscope||Eclipse Ts2R Compact Inverted Research Microscope|
|Eclipse Ts2 Routine Inverted Microscope|
|DS-Ri2 Colour Microscope Camera||DS-Qi2 Monochrome Microscope Camera|
|DS-Fi3 High-definition Colour Microscope Camera|
Sale ends 31 January 2020Read More