NIS Upgrades for Windows 10
Nikon are providing incentive pricing for NIS upgrades to allow operation on Windows 10.
Software Update Agreements are available to get you up to the latest version of NIS, which will allow the transition to Windows 10.
Whether it's now or something you need to budget for, contact us to ask for a quotation or if you have any questions about what exactly is required. With current NIS promotional pricing, now is the time to get ready. Offer ends 29 February 2020.Read More
Nikon End of Year Sale - Continues !
Significant savings are now available on Nikon's range of optical microscopes and digital cameras.
Contact us today for a quotation !
|Eclipse Ni Advanced Research Upright Microscope||Eclipse Ci Clinical Upright Microscope|
|Eclipse E200 Educational Microscope||Eclipse E100 Student Microscope|
|SMZ25 Advanced Research Stereomicroscope||SMZ18 Advanced Research Stereomicroscope|
|SMZ1270 Zoom Stereomicroscope||SMZ800N Zoom Stereomicroscope|
|SMZ745 Zoom Stereomicroscope||SMZ445 Compact Stereomicroscope|
|Eclipse Ti2 Advanced Research Inverted Microscope||Eclipse Ts2R Compact Inverted Research Microscope|
|Eclipse Ts2 Routine Inverted Microscope|
|DS-Ri2 Colour Microscope Camera||DS-Qi2 Monochrome Microscope Camera|
|DS-Fi3 High-definition Colour Microscope Camera|
Sale ends 31 January 2020Read More
Introducing the New Sona sCMOS Camera
The latest model in the Sona back-illuminated sCMOS microscopy camera series has arrived.
The NEW Sona 4.2B-6 provides a superb balance of sensitivity, speed and resolution, making it perfectly suited to many challenging imaging applications. The new model joins the Sona 4.2B011, which offers the largest possible field of view at 32mm.
- High sensitivity: Up to 95% QE
- Fast Speeds: Up to 74fps
- Large Field of View: Up to 32mm
- Deep Cooled: -45°C cooling
- Protected: UltravacTM sensor enclosure
Webinar : How to Improve Characterisation Efficiency for EBSD and EDS Applications
Friday 13 December
Auckland (NZDT) : 5:00am
Brisbane (AEST) : 2:00am
Sydney, Canberra, Melbourne, Hobart (AEDT) : 3:00am
Adelaide (ACDT) : 2:30am
Perth (AWST) : 12:00am
Energy Dispersive Spectroscopy (EDS) and EBSD are well-established microanalysis tools for today's characterisation laboratories. New developments in both hardware and software allow for improved efficiencies for users. In this webinar, improvements using EDAX's APEXTM and OIMTM Analysis software will be presented, showing users how they can accomplish more with less effort and time.
Presented by EDAX EBSD Product Manager, Matt Nowell.Read More
Webinar : Accelerating Semiconductor Processes Control
Tuesday 17 December
Auckland (NZDT) : 10:00pm
Brisbane (AEST) : 7:00pm
Sydney, Canberra, Melbourne, Hobart (AEDT) : 8:00pm
Adelaide (ACDT) : 7:30pm
Perth (AWST) : 5:00pm
Recent advances in 3D Optical Metrology accelerate in-line quality control for both front and back end processes. In this webinar, Bruker present case studies that address improving yield, identifying root cause failure and driving next generation device development from bare wafer to final packaged device.
Bruker will highlight requirements for advanced telecommunication, compact on-board electronics, and electric vehicles covering metrology needs for denser interconnect networks, finer redistribution layer (RDL), direct wafer to wafer bonding and wafer fan-out packaging.
Front end (FEOL) examples will include:
- Wafer bin roughness and edge roll-off
- CMP efficiency full die flatness
- CD metrology including TSV, deep trench RIE (Bosch process)
- Epi layer defect quantification in high power devices
Back end (BEOL) and packaging examples will address:
- Under Bump Metallisation (UBM)
- Recess defect inspection
- Full die screening for dense interconnect control
Speaker: Samuel Lesko, Senior Manager for Optical and Tribology Applications, Bruker Nano Surfaces DivisionRead More