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X-Ray sCMOS Camera

The new Marana-X sCMOS camera from Andor integrates the latest in scientific CMOS (sCMOS) designed specifically for ultrafast soft X-ray/EUV tomography and High Harmonic Generation (HHG) applications.

Marana-X represents a significant technoloigcal advancement for applications that traditionally have used slow scan CCD cameras. It overcomes the traditional limitation sof slow-scan CCD's in the soft X-ray-EUV energy range by offering simultaneously high frame rates, high-sensitivity and high dynamic range, without compromise.

It integrates the first “uncoated”, 4.2 Megapixel sCMOS sensor with >90% quantum efficiency in the 80 eV-1keV range, 74 frame/s full frame and superb dynamic range. This unique combination allows users to better sample dynamic phenomena, and to greatly increase high quality result outputs, while minimising experimental time, for example large tomographic datasets.

sCMOS’ inherent shutter-less technology addresses the inconvenience associated with traditional mechanical shutters lifetime and limited repetition rates. Moreover, the Marana-X features a convenient USB3 plug and play interface and a robust CoaXPress interface more suited to challenging high energy physics environments.

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Nikon End of Year Sale is Now On !

Significant savings are now available on Nikon's range of optical microscopes and digital cameras. Contact us today for a quotation !

 

Eclipse Ni Advanced Research Upright Microscope      Eclipse Ci Clinical Upright Microscope
   
SMZ25 Advanced Research Stereomicroscope    SMZ18 Advanced Research Stereomicroscope
SMZ1270 Zoom Stereomicroscope  SMZ800N Zoom Stereomicroscope
SMZ745 Zoom Stereomicroscope   SMZ445 Compact Stereomicroscope
   
Eclipse Ti2 Advanced Research Inverted Microscope    Eclipse Ts2R Compact Inverted Research Microscope
Eclipse Ts2 Routine Inverted Microscope  
   
DS-Ri2 Colour Microscope Camera DS-Qi2 Monochrome Microscope Camera
DS-Fi3 High-definition Colour Microscope Camera  


Sale ends 31 January 2021            

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Advanced In-Situ Nanomechanical Test Instrument

Bruker Nanosurfaces has announced the release of the Hysitron PI 89 SEM PicoIndenter, which provides nanomechanical testing capabilities inside a scanning electron miroscopy (SEM) at higher loads and in more extreme environments than previously possible. This will benefit researchers' understanding of the deformation mechanisms of high-strength materials.

 

The PI 89 SEM Picoindenter is the first in-situ instrument with two rotation and tllt stage configuations. This enables flexible sample positioning toward the electron column for top-dwn imaging, tilting toward the FIB column for milling, spindle rotation for crystallographic alignment, and compatibiltiy with a wide range of detectors to enable structure-property correlation of complex materials.

 

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Benchtop 3D Optical Profilometers

Bruker has released the next-generation benchtop ContourX 3D Optical Profilometers. The white light interferometry (WLI) platform features Bruker's new USI mode - a universal scanning mode that automatically determines the optimal measurement parameters for best metrology restuls. Additionally, a 5MP camera and new stage design significantly boosts large-area stitching, allowing for the collection of 1000 high-resolution stitched fields. This combination of features and capabilities enables greater convenience and productivity in a host of demanding research and industrial aplications ranging from studying novel material structures and characterising manufactured components for medical, automotive and aerospace.

 

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8-channel LED Illumination

The arrival of the pE-800 sees LED's take centre stage as the widefield illumination method of choice. Featuring eight individually controllable LED's and lightening fast TTL switching, the pE-800 delivers the highest quality data with minimum total cost of ownership. Versatile, intuitive and backed by CoolLED's world-renowned support and a 36-month warranty, the pE-800 with liquid light guide delivery makes next generation LED ilumination accessible to all.

 

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