News

Date : Tuesday 11 March 2025
Time : 2pm NZDT  |  12 midday AEDT  |  9am AWST

In this webinar, we will explore how stylus profilers can characterise a diverse range of materials, particularly in microelectronics and semiconductor applications. Additionally, we will introduce Bruker’s new 11th generation Dektak Pro^TM Stylus Profiler, providing even more enhanced operability, reliability, and measurement accuracy. Presented by Christian Gow.

The new Dektak Pro^TM stylus profilometer is the next-generation profiler in the industry-leading Dektak® product line. Incorporating over 55 years of innovation, the new benchtop system provides an expanded measurement area up to 200 mm of full-sample access for semiconductor applications, as well as improved productivity with improved user experience and measurement accuracy. Dektak Pro incorporates advancements that solidify the brand as the world's most advanced stylus profiler suitable for R&D, process development and QA/QC present and future needs across a range of industrial and research markets.

Date : Friday 14 February 2025
Time : 1:30pm NZDT  |  11:30am AEDT  |  8:30am AWST
 

Join us as we venture into the applications of how Bruker's latest AFM technology can help you in your research and work. Dimension Nexus™ delivers an ideal combination of data quality, experiment flexibility, and ease of use in a small-footprint system. It incorporates the milestone innovations of Bruker's NanoScope® 6 controller and PeakForce Tapping® technology to deliver more functionality than competing systems in its class. Suitable for both routine and custom experiments and easily upgradable in the field, Nexus consistently generates highly accurate, repeatable, publication-ready results for a wide range of sample types in both research and industry applications.

We look forward to seeing you in the webinar.

Webinar Speakers : Christian Gow, Coherent Scientific

SANTA BARBARA, California, December 2, 2024 – At the 2024 MRS Fall Meeting & Exhibit, Bruker Corporation (Nasdaq: BRKR) today announced the launch of the Dimension NexusTM atomic force microscope (AFM). Dimension Nexus is the newest addition to the industry-leading Dimension® AFM product line, which has had more than 4600 systems installed around the world. With the latest-generation NanoScope® 6 controller, this new small-footprint AFM delivers wider access to Bruker’s exclusive PeakForce Tapping® technology and over 50 AFM modes. The upgradability and enhanced ease of use of Dimension Nexus provides an optimal intersection of performance and value for the evolving needs of both growing labs and multi-user facilities.

When : Tuesday 29 October 2024

Time : 7pm NZDT, 5pm AEDT, 2pm AWST

We will introduce Bruker’s new 11th generation Dektak Pro Stylus Profiler, providing even more enhanced operability, reliability, and measurement accuracy to enhance and extend the qualities that make Dektak synonymous with stylus profiling.

Additionally we will explore how stylus profilers can characterise a diverse range of materials, particularly in microelectronics and semiconductor applications. Many processes in semiconductors, optical coatings, and micro-electromechanical systems (MEMS), as well as research in flexible electronics and sensors, depend on accurate thickness and etch-depth measurements. Among their various metrology capabilities, stylus profilers excel at delivering exceptional step height measurements at both the nanoscale and microscale.

Bruker Corporation have announced the release of the Dektak Pro^TM stylus profilometer, the next-generation profiler in the industry-leading Dektak® product line. Incorporating over 55 years of innovation, the new benchtop system provides an expanded measurement area up to 200 mm of full-sample access for semiconductor applications, as well as a shortened time to results with improved user experience and measurement accuracy. Dektak Pro incorporates advancements that solidify the brand as the world’s most advanced stylus profiler, positioning it to address R&D, process development, and QA/QC present and future needs across a host of industrial and research markets.

Widely utilised in microelectronics, semiconductor, display, solar, medical, and materials science markets, Dektak stylus profilers are an essential precision metrology instrument found in literally hundreds of production, research, and failure analysis facilities around the world. Dektak systems are employed in both 2D profilometry and 3D surface profiling applications to measure stress, nanometer film thicknesses, and step heights with better than 4 angstrom repeatability. The new Dektak Pro introduces step height and stress measurement updates that expand its usage. A streamlined automatic step detection routine requires less user-defined parameters for a simplified analysis that reduces user-based variability. 2D stress measurement analysis is now more customisable than ever, allowing for user-defined areas and refining precision through artifact thresholds. Fast characterisation of wafer warpage and 3D stress analysis are also made possible by new automatic centering and wafer mapping features.

For further information please contact Michael Buckett or read more.