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Webinar : Nanoscope 6 : Benefits of the Added Capability and Performance

With continuous developments over the past more than three decades, atomic force microscopy (AFM) has become an essential characterization technique, enabling the discoveries across a nearly countless array of disciplines and applications due to its unique capability of conveying rich physical and chemical information at nanometer scale. As the leader in the advances of AFM technology since the introduction of the first commercial system in the 1980s, Bruker is proud to release the brand-new Nanoscope 6 controller. With the full-spectrum hardware upgrades, the Nanoscope 6 controller not only boosts the AFM performance, but also provides many new capabilities and features, which could offer scientists new opportunities to obtain richer and finer information on complex samples. 20 times faster data acquisition and processing can capture fine details hidden within the force-distance curves in the popular PeakForce Tapping modes, and it also significantly improves the signal-to-noise ratio in other modes like Tapping mode and Contact Resonance-based modes. Switching Spectroscopy PFM mode offers a full suite to quantify nanoscale switching dynamics in ferroelectrics, from data collection to automatic data analysis. AFM-nDMA provides an accurate and complete solution to access the viscoelastic properties at nanoscale.

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Webinar : The Newest AFM-IR Platform with Photothermal IR Nanospectroscopy and AFM Capabilities

Wednesday 18 May 6pm NZST, 4pm AEST, 2pm AWST
 


 

This webinar aims to introduce the NEW Dimension IconIR, a system that combines Bruker’s industry-leading Dimension Icon® AFM and nanoIR™ photothermal IR nanospectroscopy to establish new standards in nanoscale property mapping. The IconIR delivers a comprehensive correlative spectroscopy and microscopy solution for quantitative nanochemical, nanomechanical and nanoelectrical characterisation on a single platform.
 

In the webinar we will talk about the features and capabilities of the Dimension IconIR, the new technique-surface sensitive AFM-IR is discussed as well.
 

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Webinar : Optical Profiler Characterisation of Surface Texture Using White Light Interferometry

Friday 13 May, 5pm NZST, 3pm AEST, 1pm AWST

 

 

White light interferometry (WLI) based characterisation techniques is widely used by the industrial sector and scientific community to drive innovation and the success of critical research projects, crucial developments, and fundamental productions and process controls.   Bruker is the worldwide leader in WLI based 3D surface measurement and inspection, offering fast, non-contact analyses for samples ranging in size from microscopic IC to entire engine blocks. The newly launched ContourX series optical profilometers are the culmination of ten generations of proprietary Wyko® Technology advances that provide the high sensitivity and stability necessary for precision 3D surface measurements in applications and environments that are challenging for other metrology systems.

 

This webinar provides an introduction of white light interferometry (WLI)-based advanced materials characterisation, including techniques and practical considerations. The speaker will share various research and industrial applications such as surface roughness, waviness analysis and step height analysis.  The speaker will also introduce some of the useful WLI features and functions from Bruker’s latest ContourX WLI optical profiler.

 

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Webinar Series : Nano Mechanical Properties of Polymers Measurement

Wednesday 27 April 2022, 3pm NZST, 1pm AEST, 11am AWST
 


Polymeric materials consist of long chains of macromolecules; these macromolecular chains form an organised or unorganised structure. Deformation of polymers is accomplished by the motion of polymer chains relative to each other. Sliding polymer chains past each other takes some time, which is time-dependent deformation. That is, mechanical properties of polymers is not elastic-plastic but visco-elastic-plastic. Therefore dynamic tests are important to polymers.

 

The general reasons why someone would want to use nano-mechanical testing are precision and positioning capabilities. One of reasons is to test very specific sites with very fine position control. Bruker Hysitron’s positioning accuracy is within plus or minus 10 nanometers, which is crucial for the most demanding and challenging of applications. Combining the dynamic capacity, Hysitron’s nanoscale dynamic mechanical analysis, nanoDMA, uses high bandwidth transducer and control electronics, which are fully optimised for nanoscale dynamic testing and provide industry-leading performance, sensitivity, and a broad dynamic range. Hysitron’s unique coupled AC/DC force modulation routine enables true nanoscale mechanical characterisation and is not subjected to the slow feedback response times that plague other nanoscale dynamic stiffness techniques.

 

For polymer characterisations, Hysitron’s nanoDMA incorporates a unique reference frequency technique for thermal drift correction during the course of an experiment, enabling long-duration frequency sweeps and creep tests to be reliably performed at the nanoscale.

 

In this webinar, learn about time-dependent deformation for polymers and Bruker’s technical advantages fully optimized for nanoscale dynamic testing.

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Workshop : Introduction to Dimension IconIR

Wednesday 13 April 2022 9am PDT

 

 

The Dimension IconIR combines Bruker’s industry-leading nanoIR™ photothermal AFM-IR technology with the large-sample Dimension Icon® AFM platform to establish new standards in chemical and material property mapping with sub-10nm chemical imaging resolution and correlative microscopy.

 

Join us for this virtual workshop we will introduce photothermal AFM-IR spectroscopy on Bruker’s newest AFM-IR product, including discussion of applications and co-localized imaging with Photothermal AFM-IR and PeakForce property mapping modes.

 

Presentations by the nanoIR team will be interspersed with live demonstrations of sample measurement with the Dimension IconIR with multiple co-local datasets.

 

Workshop Speakers

Curtis Marcott
Senior Partner, Light Light Solutions

Dean Dawson
Senior Director - nanoIR, Bruker

Qichi Hu
Senior Staff Applications Scientist, Bruker

Cassandra Phillips
Application Scientist, Bruker

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